TESCAN SEM/FIB-SEM with integrated Raman spectrometry

World's first fully-integrated Scanning Electron Microscope and Raman Imaging
This novel correlative microscopy technique combines SEM and confocal Raman Imaging. Through Raman Imaging and Scanning Electron Microscopy ultra-structural surface properties can be linked to molecular compound information.
This special solution combines all features of a stand-alone TESCAN SEM and the confocal Raman imaging microscope within one instrument:
  • Quick and convenient switching between SEM and Raman measurement
  • Automated sample transfer from one measuring position to the other
  • Integrated software interface for user-friendly measurement control
  • Correlation of the measurement results and image overlay
  • No compromise in SEM and Raman imaging capabilities
TESCAN SEM/FIB-SEM with integrated Raman spectrometry
TESCAN SEM with integrated Raman spectrometry

Documents for download

RISE Microscopy Brochure
RISE Microscopy - Correlative microscopy on a new level - Complementing ultra-structural SEM with molecular Raman imaging. Download the brochure!
pdf – 1.7 MB