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VEGA 3 SB - Scanning Electron Microscope

VEGA 3 SB Technical features:

The VEGA 3 SB belongs to the VEGA series of scanning electron microscopes. This instrument is configured with a tungsten heated cathode and is a state of the art, workhorse SEM that can address a wide range of applications.

Modern Electron Optic Design

  • A unique four-lens Wide Field Optics™ design offering a variety of working and displaying modes.
  • The proprietary Intermediate Lens (IML) that functionally creates a continuously adjustable aperture which does not require any mechanical adjustment.
  • The use of advanced materials for our lenses and coils allows for an ultra-fast imaging rate down to 20 ns/pixel with minimized static and dynamic distortion effects.
  • In-Flight Beam Tracing™ for high precision real-time computation of optical parameters.
  • A column design with no mechanical centering elements, allowing fully automated column set-up and alignment, delivering uncompromised ease of use.
  • Live stereoscopic imaging, using our advanced 3D Beam Technology, opening the micro and nano-world for 3D imaging and metrology.
  • An imaging system that allows acquisition of 16K X 16K pixel images with 16 bit pixels.

Chamber and Plinth Design

  • A large chamber with an extended 3 axes fully motorized compucentric stage
  • 10 chamber interface ports with optimized analytical geometry and best-in-class flexibility for integrating third part accessories.
  • Fast imaging rates due to first class YAG-based detectors
  • A choice of fully integrated composite damping, pneumatic or optional active vibration isolation, ensuring the best protection in poor environments, reducing the influence of ambient vibration
  • A comprehensive choice of optional detectors and accessories
  • Oil free high vacuum design utilizing a turbo molecular pump.

Detectors

  • YAG-based Backscattered Detectors for excellent durability, high speed imaging and excellent signal to noise ratio.
  • Multiple Diode Backscattered Detector
  • YAG-based Secondary Electron detector for long lifetime, excellent signal to noise ratio and durability
  • Low Vacuum Secondary Electron Detector for Variable Pressure imaging.
  • Optimized CCD cameras for assisting in sample navigation
  • TESCAN Cathodoluminesence Detectors, Optimized for visible light wavelengths or wideband operation, providing complimentary chemical information

Software and Automated Analysis

  • High precision stage suitable for demanding applications in automated analysis
  • 3D metrology software for Height, Surface and Profile surface measurements
  • Correlative Microscopy
  • Communication with third party products via TCP/IP interface (e.g. automated EDX analysis)
  • Software extensions for Particle and Mineral Analysis, large area imaging and morphology analysis
  • Software customization
  • Built-in scripting for user defined applications
  • Built-in image management and report generation
  • Multi-user environment is localized in many languages
  • User and Accounting software for tracking of users in multi user environments.
  • Two Graphical User Interfaces, including an EasySEM mode for novice users
  • Built-in remote access/diagnostics for post sales support

VEGA 3 SB Models:

VEGA 3 SBH

A dedicated high vacuum scanning electron microscope, suitable for a wide range of applications, where conductive samples are investigated.

VEGA 3 SBU

A variable pressure variant that supplements all the advantages of the high vacuum model with extended facility for low vacuum operation. This allows investigation of non-conductive materials in their natural and uncoated state.

Specification of selected parameters VEGA 3 SB:

SEM Column
Electron Gun
Tungsten heated filament
Resolution (SE)
3 nm at 30 kV
8 nm at 3 kV
Resolution - Low Vacuum (BSE, LVSTD)

3.5 nm at 30kV
Accelerating Voltage
200 V to 30 kV
Probe Current
1 pA to 2μA
Chamber
Internal diameter
160 mm
Door width 120 mm
Number of ports
10
Chamber suspension
mechanic
Working Vacuum
High vacuum mode
< 9 × 10-3 Pa
Medium vacuum (SBU)
3 – 150 Pa
Low vacuum (SBU)
3 – 500 Pa
Stage
Type eucentric
Movements
X = 45 mm – motorized
Y = 45 mm – motorized
Z = 27 mm – manual
Z" = 6 mm – manual
Rotation: 360˚ continuous – motorized
Tilt: -90˚ to + 90˚
eucentrical – manual
Specimen height
maximum 36 mm
EasyEDX Microanalyser
Detector type SDD Detector
Detector cooling Peltier couple (LN2 free)
Energy Resolution
133 eV (Mn Ka) at 100 kcps
Max. input count rate
150 kcps
Detection range
from B(5) to Am(95)
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Product Focus

TIMA


The TESCAN Integrated Mineral Analyzer (TIMA) is a new SEM-based automated mineralogy solution for the mining and minerals processing industries. TIMA measures mineral abundance, size by size liberation, mineral association, grain size and PGM search automatically on multiple samples of grain mounts, thin sections or polished sections. Applications include ore characterization, process optimization, remediation and the search for precious metals and rare earths.

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