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VEGA 3 LM - Scanning Electron Microscope

VEGA 3 LM Technical features:

The VEGA 3 LM belongs to the VEGA series of scanning electron microscopes. This instrument can be configured with a Lab6 or tungsten heated cathode and is a state of the art, research grade SEM that can address a wide range of applications. This instrument excels when analytical flexibility is required.

Modern Electron Optic Design

  • A unique four-lens Wide Field Optics™ design offering a variety of working and displaying modes.
  • The proprietary Intermediate Lens (IML) that functionally creates a continuously adjustable aperature which does not require any mechanical adjustment.
  • The use of advanced materials for our lenses and coils allows for an ultra-fast imaging rate down to 20 ns/pixel with minimized static and dynamic distortion effects.
  • In-Flight Beam Tracing™ for high precision real-time computation of optical parameters.
  • A column design with no mechanical centering elements, allowing fully automated column set-up and alignment, delivering uncompromised ease of use.
  • Live stereoscopic imaging, using our advanced 3D Beam Technology, opening the micro and nano-world for 3D imaging and metrology.
  • An imaging system that allows acquisition of 16K X 16K pixel images with 16 bit pixels.

Chamber and Plinth Design

  • A large chamber with an extended 5 axes fully motorized compucentric stage
  • 11 chamber interface ports with optimized analytical geometry and best in class flexibility for EDX, WDX and EBSD
  • Fast imaging rates due to first class YAG-based detectors
  • A choice of fully integrated composite damping, pneumatic or optional active vibration isolation, ensuring the best protection in poor environments, reducing the influence of ambient vibration
  • A comprehensive choice of optional detectors and accessories
  • Oil free high vacuum design utilizing a turbo molecular pump.

Detectors

  • YAG-based Backscattered Detectors for excellent durability, high speed imaging and excellent signal to noise ratio.
  • Multiple Diode Backscattered Detector
  • YAG-based Secondary Electron detector for long lifetime, excellent signal to noise ratio and durability
  • Low Vacuum Secondary Electron Detector for Variable Pressure imaging.
  • Optimized CCD cameras for assisting in sample navigation
  • TESCAN Cathodoluminesence Detectors, Optimized for visible light  wavelengths or wideband operation, providing complimentary chemical information

Software and Automated Analysis

  • High precision stage suitable for demanding applications in automated analysis 
  • 3D metrology software for Height, Surface and Profile surface measurements
  • Correlative Microscopy
  • Communication with third party products via TCP/IP interface (e.g. automated EDX analysis)
  • Software extensions for Particle and Mineral Analysis, large area imaging and morphology analysis
  • Software customization
  • Built-in scripting for user defined applications
  • Built-in image management and report generation
  • Multi-user environment is localized in many languages
  • User and Accounting software for tracking of users in multi user environments.
  • Two Graphical User Interfaces, including an EasySEM mode for novice users
  • Built-in remote access/diagnostics for post sales support

VEGA 3 LM Models:

VEGA 3 LMH

A dedicated high vacuum scanning electron microscope, suitable for a wide range of applications, where conductive samples are investigated.

VEGA 3 LMU

A variable pressure variant that supplements all the advantages of the high vacuum model with extended facility for low vacuum operation. This allows investigation of non-conductive materials in their natural uncoated state.

Specification of selected parameters VEGA 3 LM:

SEM Column
Electron Gun
Tungsten heated filament / optionally LaB6
Resolution (SE)
3 nm at 30 kV / 2 nm at 30 kV (LaB6)
8 nm at 3 kV / 5 nm at 3 kV (LaB6)
Resolution - Low Vacuum (BSE, LVSTD)
3.5 nm at 30kV / 2.5 nm at 30 kV (LaB6)
Accelerating Voltage
200 V to 30 kV
Probe Current
1 pA to 2μA
Scanning speed
20ns to 10ms / pixel
Chamber
Internal diameter
230 mm
Door width 148 mm
Number of ports
11+
Chamber suspension Standard:
- pneumatic
Options:
- mechanical
- active vibration isolation
Working Vacuum
High vacuum mode
< 9 × 10-3 Pa
Medium Vacuum (LMU)
3 – 150 Pa
Low vacuum mode (LMU)
3 – 500 Pa (optionally up to 2000 Pa)
Option (LMU)
Water Vapor Inlet
Stage
Type compucentric
Movements
Fully motorized:
X = 80 mm,
Y = 60 mm,
Z = 47 mm
Rotation: 360˚ continuous
Tilt: -80˚ to + 80˚ *
* -  WD dependent
Specimen height
maximum 81 mm
Stage X x Y Range Options
40x40 mm;
60x60 mm

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