Buying a used SEM reconditioned by the SEM manufacturer is a safe way to get a reliable working SEM for a nice price.
TESCAN produces a number of software solutions. The sophisticated control software is a standard part of every scanning electron microscope produced by TESCAN. There is also a standalone image processing software ATLAS. The software is modular with software extensions for various purposes.
Common Software Features
Our aim from the beginning is to provide a customer software which will be intuitive and user-friendly for both professional or inexperienced microscopist. The current third generation of SEM microscopes is equipped with new software which is simple, transparent and even more intuitive.
- Multi-user environment
- Multi-language support
- Image manager with search over imaging conditions
- Standard format of images like TIFF, BMP, JPEG, JPEG2000, PNG, GIF, PGM, PPM
- Fast Report Generator with export to multiple formats, including MS Word, Open Office, PDF etc.
- Detailed on-line help
Professional for Scientific Work:
- High quality 16-bit image processing
- Sophisticated calibration and measurement tools
- Extension modules optimized for particular purposes
The creation of favorable conditions for the complex analysis of specimens, together with the possibility of high-quality images of the specimen surface for morphological studies, was a high priority in the design of TESCAN microscopes from the beginning of their development.
Using the modern designing and manufacturing systems we are flexible and open to develop and manufacture custom modifications or special custom systems.
Transmission electron microscopy is widely used in the field of Life Science or Material Engineering. Therefore TESCAN has developed an adaptor that provides a complementary method for image acquisition of the transmitted electrons - scanning transmission electron microscopy detector (STEM).
High efficiency SE detector is placed in the objective lens.
A cathodoluminescence detector attached to a TESCAN Scanning Electron Microscope (SEM) is capable of producing high-resolution digital cathodoluminescent (CL) images of luminescent materials.
The Low Vacuum Secondary Electron TESCAN Detector is a unique solution developed and patented by TESCAN. A modified Everhart-Thornley design equipped with a YAG scintillator provides a lots of merits.
TESCAN offers a SEM Control Panel as another option to the standard controllers like multipurpose trackball or EasySEM™ touch screen control interface. The Control Panel is designed to fully control the microscope without need to use another controlling device. Moreover, the user can work in the fullscreen image mode and operate all imaging functions simultaneously.
Nanorobotics Manipulators are optional accessory expanding the TESCAN FIB and SEMs to a material processing and analytical Workbench.