Brno, Czech Republic, 07-18-11: TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the LYRA GM FIB-SEM workstation "A New Multifunctional Tool for Nanotechnology"
TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the LYRA GM FIB-SEM workstation "A New Multifunctional Tool for Nanotechnology"
Expanding on the success of the European FIBLYS project (http://www.fiblys.eu), the LYRA GM Nanotechnology workstation provides a unified platform, integrating an unprecedented range of nano- structuring, manipulation, imaging, and analytical tools including high resolution Field Emission Scanning Electron Microscopy (FESEM), a Focused Ion Beam (FIB), Energy Dispersive X-Ray Spectrometry (EDX), Wavelength Dispersive X-Ray Spectrometry (WDX), Electron Backscattered Diffraction (EBSD), Cathodoluminescence (CL), Electron Beam Induced Current (EBIC), Scanning Probe Microscopy (SPM/AFM), and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS).
The LYRA GM Nanotechnology workstation is the first in its class to integrate a "Time of Flight" secondary ion mass spectrometer and in situ "Atomic Force Microscope". This new class of instrument can also accommodate a wide range of integrated nanomanipulators and Gas Injection Systems (GIS) and be configured with a variety of Focused Ion Beam sources, making it one of the most versatile Nano-manipulation and characterization tools in the world.
In combination the LYRA GM will have the ability to perform 3D tomography, 3D EBSD, 3D EDX and all of the above mentioned Nano-analytical techniques at a common analytical working distance making it the most advanced Nanoanalytic tool.
The ability to perform In-situ TOF-SIMS and SPM/AFM will provide unprecedented analytical capabilities. Compared to EDX, TOF-SIMS provides better limits of detection, better spatial resolution, depth profiling and the ability to detect isotopic and molecular species. Chemical imaging with resolution of about 50 nm have been demonstrated. The integration of an in-situ AFM not only provides roughness information, but will also allow true 3-dimensional chemical images to be reconstructed from SIMS measurements.
The integration of so many complementary analytical tools in one high resolution FIB-FESEM will allow researchers to characterize complex samples and solve analytical problems rapidly without exposing samples to contamination from atmospheric exposure and/or human handling.
The LYRA GM will be showcased next month, August 8th thru the 11th at the upcoming Microscopy and Microanalysis conference in Nashville, Tennessee.
TESCAN is a leading provider of scientific instrumentation and is well known for its innovation and openness to work with researchers, customizing applications to fit specific needs. Established in 1991, TESCAN is an ISO certified company with a long tradition of excellence. Over 1000 TESCAN Electron Microscopes and Focused Ion Beam workstations have been delivered around the world.
TESCAN USA "Performance in Nanospace"
www.tescan-usa.com
Contact: Jeff Streger
Vice President, TESCAN USA
Tel: 724-772-7433
E-mail: info@tescan-usa.com
