01/23/12 TESCAN has introduced the TESCAN Integrated Mineral Analyzer (TIMA). TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry.
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10/03/11 TESCAN has introduced the FERA3 XMH – a high resolution Schottky Field Emission scanning electron microscope with a fully integrated Plasma source focused ion beam.
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09/12/11 TESCAN USA has established an applications and demonstration lab in Northern California.
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