News

Geology Up-Close lecture with TESCAN
Presentation on the role of TESCAN SEM systems in Earth Sciences
Mar/22/2017
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TESCAN at the Indian Institute of Technology
Unique FIB-SEM system with four integrated nanomanipulators
Routine Ga FIB TEM sample preparation of a 14nm FinFET device
Check out this new application example on ultra-thin TEM specimen from a...
Mar/21/2017
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TESCAN Q-PHASE in Dresden
Workshop with TESCAN specialists
Mar/21/2017
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Improving properties of nanosheets
TESCAN FE-SEM MIRA3 for characterisation of nanostructures
Mar/20/2017
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Towards degradation-resistant implant biomaterials
TESCAN FE-SEM MIRA3 for investigating particle morphology
Mar/20/2017
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TESCAN microscopes helping researchers find novel control strategies of diseases
Unlocking the mechanisms of mosquito’s immune system
Mar/17/2017
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TESCAN at FICS Research Conference on Cybersecurity
The conferece was held at the University of Florida on March 7-8, 2017
Mar/16/2017
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High-resolution non-destructive 3D imaging of integrated circuits
TESCAN Xe plasma FIB-SEM FERA3, an essential tool for sample preparation
Mar/16/2017
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First TESCAN FIB/SEM in India
Certificate acknowledge ceremony  
Mar/15/2017
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