TESCAN USA - Value and Excellence in SEMs

TESCAN USA is a leading supplier in North America of Scanning Electron Microscopes and Focused Ion Beam workstations. The quality, performance and reliability of our products are the foundation of our business, serving customers in academia, industry and the government sector. With most of our staff being electron microscopists, and analysts, we understand the diverse needs of our customers, offering custom solutions to meet specific application requirements.

News

Events

Application Gallery

01/30/12 Jaroslav Klíma was named Regional Entrepreneur of the Year 2011 in a prestigious competition held by Ernst & Young for second time. more >>>

01/23/12 TESCAN has introduced the TESCAN Integrated Mineral Analyzer (TIMA). TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry. more >>>

10/03/11 TESCAN has introduced the FERA3 XMH – a high resolution Schottky Field Emission scanning electron microscope with a fully integrated Plasma source focused ion beam. more >>>

All news >>>

02/19/12 - 02/20/12
Society for Mining, Metallurgy and Exploration 2012

02/24/12
DC FIB Users Group Meeting

03/05/12 - 03/06/12
Florida American Vacuum Society

03/11/12 - 03/15/12
Pittsburgh Conference

All events >>>

TEM lamella sample prepared with the TESCAN LYRA3 FIB-SEM workstation.

more >>>

	Contact Sales Contact Customer Care
	Customer Testimonials
	Leasing Options
	Follow us on Facebook
	Follow us on LinkedIn

Product Focus

TIMA

The TESCAN Integrated Mineral Analyzer (TIMA) is a new SEM-based automated mineralogy solution for the mining and minerals processing industries. TIMA measures mineral abundance, size by size liberation, mineral association, grain size and PGM search automatically on multiple samples of grain mounts, thin sections or polished sections. Applications include ore characterization, process optimization, remediation and the search for precious metals and rare earths.

more >>>