TESCAN USA - Value and Excellence in SEMs

TESCAN USA is a leading supplier in North America of Scanning Electron Microscopes and Focused Ion Beam workstations. The quality, performance and reliablity of our products are the foundation of our business, serving customers in academia, industry and the government sector. With most of our staff being electron microscopists, and analysts, we understand the diverse needs of our customers, offering custom solutions to meet specific application requirements.

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10/03/11 TESCAN has introduced the FERA3 XMH – a high resolution Schottky Field Emission scanning electron microscope with a fully integrated Plasma source focused ion beam. more >>>

09/12/11 TESCAN USA has established an applications and demonstration lab in Northern California. more >>>

07/18/11 The the LYRA GM FIB-SEM Workstation Introduced: A New Multifunctional Tool for Nanotechnology more >>>

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02/19/12 - 02/20/12
Society for Mining, Matallurgy and Exploration 2012

02/24/12
DC FIB Users Group Meeting

03/05/12 - 03/06/12
Florida American Vacuum Society

03/11/12 - 03/15/12
Pittsburgh Conference

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TEM lamella sample prepared with the TESCAN LYRA3 FIB-SEM workstation.

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Product Focus

The LYRA 3 GM Nanotechnology FIB-FESEM workstation is the first in its class to integrate a “Time of Flight” secondary ion mass spectrometer and in situ “Atomic Force Microscope” on a FIB-FESEM instrument. The LYRA 3 GM FIB-FESEM can also accommodate a wide range of integrated nanomanipulators and Gas Injection Systems (GIS), and can be configured with a variety of Focused Ion Beam sources, making it one of the most veratile Nano-manipulation and characterization tools in the world.
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